MOS IC Reliability Assurance Data and Application Research
|School||Nanjing University of Technology and Engineering|
|Keywords||Data Technology Statistical techniques Testing technology Failure Analysis Reliability Growth|
Bathtub curve departure from the life cycle of the integrated circuit to ensure data acquisition , analysis, evaluation as a means for the purpose of MOS integrated circuit TM engineering reliability guarantee , TM integrated circuit engineering reliability guarantee . the problems encountered by the traction research to enhance and ensure the reliability of the integrated circuit , as well as application specific integrated circuit engineering , TM . Integrated circuits as much as possible before the factory removed early failure after leaving the factory to meet the reliability and life requirements . To achieve such a request , the need for test, measurement , analysis and improvement , evaluation , characterization . Firstly, build the theoretical basis of the reliability of the data protection technology , including: environmental stress screening , statistical techniques , testing technology , reliability growth technology , failure analysis , and product life assessment ; reliability of the data protection technology theory for engineering laid the foundation of reliability guarantee . On the basis of theoretical analysis , combined with MOS integrated circuit TM to carry out the by aging test real-time monitoring and analysis to determine the stress aging research , to further ensure the screening rate requirements ; the ASL1000 test system for testing software, hardware TM circuit of design, to achieve the purpose of the automatic test , and laid the foundation for the collection and analysis of data ; determine the key process in accordance with the TM circuit characteristics , the use of statistical analysis to monitoring and evaluation process , in order to ensure the process and the level of reliability and lay the foundation ; typical failure analysis and improvement ; reliability growth testing and failure analysis based on the optimization of the process , make the product to achieve the desired reliability index requirements.