Dissertation
Dissertation > Industrial Technology > Radio electronics, telecommunications technology > Microelectronics, integrated circuit (IC) > General issues > Reliability and routine testing

MOS IC Reliability Assurance Data and Application Research

Author HongMing
Tutor WuXiaoSongï¼›LiuShanXi
School Nanjing University of Technology and Engineering
Course Weapons engineering
Keywords Data Technology Statistical techniques Testing technology Failure Analysis Reliability Growth
CLC TN406
Type Master's thesis
Year 2008
Downloads 136
Quotes 2
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Bathtub curve departure from the life cycle of the integrated circuit to ensure data acquisition , analysis, evaluation as a means for the purpose of MOS integrated circuit TM engineering reliability guarantee , TM integrated circuit engineering reliability guarantee . the problems encountered by the traction research to enhance and ensure the reliability of the integrated circuit , as well as application specific integrated circuit engineering , TM . Integrated circuits as much as possible before the factory removed early failure after leaving the factory to meet the reliability and life requirements . To achieve such a request , the need for test, measurement , analysis and improvement , evaluation , characterization . Firstly, build the theoretical basis of the reliability of the data protection technology , including: environmental stress screening , statistical techniques , testing technology , reliability growth technology , failure analysis , and product life assessment ; reliability of the data protection technology theory for engineering laid the foundation of reliability guarantee . On the basis of theoretical analysis , combined with MOS integrated circuit TM to carry out the by aging test real-time monitoring and analysis to determine the stress aging research , to further ensure the screening rate requirements ; the ASL1000 test system for testing software, hardware TM circuit of design, to achieve the purpose of the automatic test , and laid the foundation for the collection and analysis of data ; determine the key process in accordance with the TM circuit characteristics , the use of statistical analysis to monitoring and evaluation process , in order to ensure the process and the level of reliability and lay the foundation ; typical failure analysis and improvement ; reliability growth testing and failure analysis based on the optimization of the process , make the product to achieve the desired reliability index requirements.

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