Study on Key Problems of Volume Holographic Disk Storage Technology |
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Author | WanYuHong |
Tutor | TaoShiZuo;WangDaYong |
School | Beijing University of Technology |
Course | Optics |
Keywords | Disc holographic storage Space angle multiplexing Photorefractive crystal Sub- orbital thermal fixed Holographic disk addressing |
CLC | TP333 |
Type | PhD thesis |
Year | 2005 |
Downloads | 302 |
Quotes | 5 |
The rapid development of information technology and computer technology for information storage technology put forward higher requirements. Volume holographic storage technology for its high storage density, large storage capacity, high data transfer rate, data search time advantage to become a considerable potential for massive information storage technology. In recent years, the volume holographic storage research in the field of boom continues to climb. How to give full play to the advantages of volume holographic storage, high storage density, large storage capacity, high data transfer rate of holographic information storage, and improve the performance of the body memory, promote the practical use of the volume holographic storage technology, in recent years the volume holographic storage hot research field. 3D disc holographic storage solution with its relatively simple access mechanism of the optical path, as well as compatibility with existing optical disc system, and more suitable for the application of large capacity data storage, and thus more practical significance. This thesis is based on the research frontier of volume holographic storage areas, on the basis of the existing theory and research, focused on how to achieve high-density, high-fidelity, nonvolatile the disc volume holographic storage. And further optimize the disc holographic storage of programs and systems to improve and enhance the performance of the disc holographic storage system, to promote the practical process of the 3D disc holographic storage technology. The papers from the study of light photorefractive crystal holographic storage performance start-depth study of the the crystal noise characteristics of multiple holographic storage conditions the the SNR loss coefficient (LSNR) mainly inspected within the crystal caused due to prolonged exposure to crystal object light scattering characteristics of the noise, i.e., the object light scattering input image like qualitative influence of noise on the holographic storage. And object light scattering caused by noise characteristics and the reference light scattering caused by noise characteristics carried out a comparative study. Experimental results show that the reference light or the objective optical crystal for a long time lighting will be established in the intracrystalline scattering noise, and the object light scattering noise impact than the reference light scattering noise significantly affected; oxidation state crystal scattering effects of noise is less than the Growth state and reduced state crystals; reflected light path the optical path compared with the transmitted light path, and the adjacent surface incidence (90 °) less susceptible to the impact of scattering noise. Should be chosen in order to decrease as much as possible the influence of the scattering noise, the actual storage system was light scattering noise alignment, and select the proper recording mode, appropriately doped crystals and post-processing to suppress scattering noise on the quality of stored images, impact. This paper presents an effective method of suppressing photovoltaic noise photorefractive crystal photovoltaic noise causes through the crystal surface coated transparent conductive film (indium tin oxide: Indium Tin Oxide, ITO) to short-circuit the crystal. The crystals in open circuit mode and short circuit mode noise and holographic storage performance parameter variations. The experimental results show that, the plating ITO film of the crystal after the short circuit mode, the SNR loss is significantly reduced, the crystal photovoltaic noise is effectively suppressed. And after a short circuit, the dynamic range of the crystal (M ~ #)