Dissertation > Industrial Technology > Machinery and Instrument Industry > Instruments, meters > Optical instruments > Physical optical instruments > Interferometer

Equal thickness interferometer for large-size digital measurement of flatness

Author GaoHui
Tutor WangQing;ZhengHongYi
School Nanjing University of Technology and Engineering
Course Optical Engineering
Keywords Equal thickness interferometer Flatness Image Processing Uncertainty Analysis
CLC TH744.3
Type Master's thesis
Year 2012
Downloads 60
Quotes 1
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